A Study of Proximity Effect in Multilayered Nb/Al Thin Film System
碩士 === 國立清華大學 === 物理學系 === 88 === We fabricate several Nb/Al multilayer samples with different parameters by using sputtering method. In our experiment, we keep the period numbers and each Nb layer thickness are 10 and 200 angstron respectively. We vary Al layer thickness from 0 to 400 angstron, the...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/98404645916473005621 |