The electrical characterization of lead zirconate titanate (PZT) thin films using atomic force microscope
碩士 === 國立清華大學 === 物理學系 === 88 === Abstract In this experiment,we discuss that grain sizes have different effect on C-V curve and P-E curve . The result is that the film of smaller grain size have high capacity and have smoother P-E curve than the flim of greater grain size meas...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/84371453595924006608 |