The electrical characterization of lead zirconate titanate (PZT) thin films using atomic force microscope
碩士 === 國立清華大學 === 物理學系 === 88 === Abstract In this experiment,we discuss that grain sizes have different effect on C-V curve and P-E curve . The result is that the film of smaller grain size have high capacity and have smoother P-E curve than the flim of greater grain size meas...
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ndltd-TW-088NTHU01980502016-07-08T04:23:16Z http://ndltd.ncl.edu.tw/handle/84371453595924006608 The electrical characterization of lead zirconate titanate (PZT) thin films using atomic force microscope 以原子力顯微鏡對鋯鈦酸鉛薄膜之電性量測 C.J. Chen 陳建宇 碩士 國立清華大學 物理學系 88 Abstract In this experiment,we discuss that grain sizes have different effect on C-V curve and P-E curve . The result is that the film of smaller grain size have high capacity and have smoother P-E curve than the flim of greater grain size measured at different areas . In the local P-E curve , we got different curve at different frequency.When the frequency is 500mHZ, we can see the local P-E curve . If we increase sweep time,the P-E curve will decay at 500mHZ and 5mHZ;how-ever,we can not see the same phenomenon at the frequency 50mHZ. Prof. Ya-Chang Prof. Joseph Ya-Min Lee 周亞謙 李雅明 2000 學位論文 ; thesis 74 zh-TW |
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碩士 === 國立清華大學 === 物理學系 === 88 === Abstract
In this experiment,we discuss that grain sizes have different effect on C-V curve and P-E curve . The result is that the film of smaller grain size have high capacity and have smoother P-E curve than the flim of greater grain size measured at different areas .
In the local P-E curve , we got different curve at different frequency.When the frequency is 500mHZ, we can see the local P-E curve . If we increase sweep time,the P-E curve will decay at 500mHZ and 5mHZ;how-ever,we can not see the same phenomenon at the frequency 50mHZ.
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Prof. Ya-Chang |
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Prof. Ya-Chang C.J. Chen 陳建宇 |
author |
C.J. Chen 陳建宇 |
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C.J. Chen 陳建宇 The electrical characterization of lead zirconate titanate (PZT) thin films using atomic force microscope |
author_sort |
C.J. Chen |
title |
The electrical characterization of lead zirconate titanate (PZT) thin films using atomic force microscope |
title_short |
The electrical characterization of lead zirconate titanate (PZT) thin films using atomic force microscope |
title_full |
The electrical characterization of lead zirconate titanate (PZT) thin films using atomic force microscope |
title_fullStr |
The electrical characterization of lead zirconate titanate (PZT) thin films using atomic force microscope |
title_full_unstemmed |
The electrical characterization of lead zirconate titanate (PZT) thin films using atomic force microscope |
title_sort |
electrical characterization of lead zirconate titanate (pzt) thin films using atomic force microscope |
publishDate |
2000 |
url |
http://ndltd.ncl.edu.tw/handle/84371453595924006608 |
work_keys_str_mv |
AT cjchen theelectricalcharacterizationofleadzirconatetitanatepztthinfilmsusingatomicforcemicroscope AT chénjiànyǔ theelectricalcharacterizationofleadzirconatetitanatepztthinfilmsusingatomicforcemicroscope AT cjchen yǐyuánzilìxiǎnwēijìngduìgàotàisuānqiānbáomózhīdiànxìngliàngcè AT chénjiànyǔ yǐyuánzilìxiǎnwēijìngduìgàotàisuānqiānbáomózhīdiànxìngliàngcè AT cjchen electricalcharacterizationofleadzirconatetitanatepztthinfilmsusingatomicforcemicroscope AT chénjiànyǔ electricalcharacterizationofleadzirconatetitanatepztthinfilmsusingatomicforcemicroscope |
_version_ |
1718341336139038720 |