Step-stress Accelerated Degradation Analysis Based on a Wiener Process
碩士 === 國立清華大學 === 統計學研究所 === 88 === Collecting accelerated degradation test (ADT) data can provide useful lifetime information for highly reliable products if there exists a product quality characteristic whose degradation over time can be related to reliability. However, conducting a constant-stres...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2000
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Online Access: | http://ndltd.ncl.edu.tw/handle/56674982965937096850 |