The Integration of Copper and Porous SiO2

碩士 === 國立清華大學 === 電子工程研究所 === 88 === The integration of copper and porous SiO2 were investigated. First, we fabricated porous SiO2 sample with different H2O/TEOS ratio to determine the optima deposition condition of the film. Secondly, the electroless plating copper/TaN or TaSi/porous SiO...

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Bibliographic Details
Main Authors: Chih-Wei Chang, 張志偉
Other Authors: Fon-Shan Huang
Format: Others
Language:zh-TW
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/95448186620923991301