Neighborhood Pattern-Sensitive Fault Testing for Semiconductor Memories
碩士 === 國立清華大學 === 電機工程學系 === 88 === This thesis presents some test algorithms which detect neighborhood pattern sensitive faults (NPSFs), including passive neighborhood pattern sensitive faults (PNPSFs) and active neighborhood pattern sensitive faults (ANPSFs). Besides ANPSFs and PNPSFs,...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54175776416233288030 |