A Built-In Self-Test Design for All Digital Phase-Locked Loop

碩士 === 國立清華大學 === 電機工程學系 === 88 === Locking the frequency and phase between external and internal clocks, the phase-locked loops (PLLs) are fundamental elements in microelectronic systems. Traditionally, the analog PLL is designed for this task and the problem is that digital circuits suc...

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Bibliographic Details
Main Authors: Yuh-Horng Liu, 劉育宏
Other Authors: Tsin-Yuan Chang
Format: Others
Language:en_US
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/76886452498649911781