The Design and Realization of A Timing Generator Circuit for High Speed Automatic Test Equipment
碩士 === 國立臺灣大學 === 電機工程學研究所 === 88 === The heart of Automatic Test Equipment（ATE）is the timing generation circuitry. The timing generators are used to format the stimulus for the Device Under Test（DUT）and determine when to compare the device outputs against expect data. A CMOS implementation is parti...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/00687939790240446217 |