Growth and mechaical properties of SiCN thin films

碩士 === 國立臺灣科技大學 === 機械工程系 === 88 === We report here the growth mechanism and the mechanical properties of a novel material SiCxNy. The nanocrystal of high nucleation density was grown by electron cyclotron resonance plasma enhanced chemical vapor deposition (ECR-CVD) and ion-beam sputtering depositi...

Full description

Bibliographic Details
Main Authors: Lo, Hung-Chun, 羅鴻鈞
Other Authors: 林舜天
Format: Others
Language:en_US
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/56256843532449333700