Annealing effect on ion-beam-sputtered titanium dioxide optical films
碩士 === 中國文化大學 === 應用化學研究所 === 88 === 英 文 摘 要 (Abstract) Atomic force microscopy(AFM)、X-ray defractometry (XRD) and spectroscopy have been empolyed to study the specific properties of the thin film of pure TiO2 and mixed TiO2-SiO2 as well. These films were prepared by proper ion bea...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/71591412506093413609 |