Testing and Diagnostic Methods for Multiple Embedded Memory
博士 === 國立中正大學 === 資訊工程研究所 === 89 === Because of the improvement in VLSI technologies, many components can be fabricated into a single chip. This leads the testing and diagnosing of embedded memory buffers more and more difficult. For the off-line testing problem, we propose a new built-in self-testi...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/49595800721985026424 |