Study of Inductively Coupled Plasma Etching on GaN
碩士 === 中原大學 === 應用物理研究所 === 89 === Abstract Inductively coupled plasma(ICP) technique was used to etch GaN epilayer. Etching rates were studied as a function of gas mixing ratio, ICP power and rf power. Surface morphology after etching was observed by using scanning electron microscope(SEM). Severa...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2001
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Online Access: | http://ndltd.ncl.edu.tw/handle/29645527473141318087 |