Study of Inductively Coupled Plasma Etching on GaN

碩士 === 中原大學 === 應用物理研究所 === 89 === Abstract Inductively coupled plasma(ICP) technique was used to etch GaN epilayer. Etching rates were studied as a function of gas mixing ratio, ICP power and rf power. Surface morphology after etching was observed by using scanning electron microscope(SEM). Severa...

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Bibliographic Details
Main Authors: Yea-Ling Lin, 林雅玲
Other Authors: Wu-Ching Chou
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/29645527473141318087