C-V Characterization Measurementof C60 Films

碩士 === 中原大學 === 應用物理研究所 === 89 === Abstract In this report, by using by C-V measurement at frequency 1M Hz from 20 K to 300 K, we measure the relations of the dielectric constant κ , ac conductance σ and dielectric relaxation time constant τ with respect to temperature of C60 sandwiched sample...

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Bibliographic Details
Main Authors: Cheng-Hua Hsiao, 蕭檉譁
Other Authors: K. C. Chiu
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/83692931209115954896