Low Power Built In Self Test Design
碩士 === 國立中興大學 === 資訊科學研究所 === 89 === BIST has emerged as a promising solution to the SOC testing problem. Most Test Pattern Generators (TPGs) used in BIST generate pseudorandom test patterns, which have low correlation between consecutive patterns and thus maximize power consumption in th...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/24097221389448540102 |