Effects of C+ and N2+ implantation on the electrical properties of liquid phase deposition Si(O,F) films

碩士 === 國立成功大學 === 材料科學及工程學系 === 89 === Abstract Effects of C+ and N2+ implantation on the electrical properties of liquid-phase-deposition (LPD)Si(O,F) films as a function of the ion dose were studied. Upon C+ implantation some Si-F bonds were decomposed concurrently with the f...

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Bibliographic Details
Main Authors: CHANG MENG HAO, 張孟浩
Other Authors: Lin Wen Tai
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/74686085795005727683