Control and Observation Structures of Analog Circuits and Built-In Self-Test Designs for D/A and A/D Converters
博士 === 國立成功大學 === 電機工程學系 === 89 === In this dissertation, we present some novel design for testability (DFT) techniques for increasing the controllability and observability of analog circuits and built-in self-test (BIST) structures for testing digital to analog converters (DAC...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95634811393414109082 |