The reliability study of Poly-Si thin -film transistors

碩士 === 國立交通大學 === 電子工程系 === 89 === Utilizing polycrystalline silicon thin-film transistors (Poly-Si TFTs) as on-glass pixel switching elements and peripheral driver circuits is the future trend for fabricating active-matrix liquid-crystal displays (AMLCDs). The improvement of the electric...

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Bibliographic Details
Main Authors: lin jun-min, 林俊銘
Other Authors: Kow-Ming Chang
Format: Others
Language:en_US
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/43537324633696371883