The effects of Surface Plasma Treatment on HSQ and Copper Electromigration

碩士 === 國立交通大學 === 電子工程系 === 89 === The bond structure change and gas desorption from chemical reaction of HSQ during thermal process was observed by FTIR and TDS. The thickness and refractive index of different curing temperature were investigated and it was found that HSQ would become m...

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Bibliographic Details
Main Authors: Chi-Tong Chen, 陳啟通
Other Authors: Bi-Shiou Chiou
Format: Others
Language:en_US
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/36949402139746089460