X-ray Absorption Fine Structure Detection of Thermal Annealing Effects on Mg-Doped GaN
碩士 === 國立交通大學 === 電子物理系 === 89 === Here we report the x-ray absorption fine structure spectroscopy (XAFS) study of a two-step thermal annealing effects on crystal structure and phase transformation of Mg-doped GaN films grown by MOVPE. Measurements were made on the K-edge energies of both...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2001
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Online Access: | http://ndltd.ncl.edu.tw/handle/59768675026357684043 |