X-ray Absorption Fine Structure Detection of Thermal Annealing Effects on Mg-Doped GaN

碩士 === 國立交通大學 === 電子物理系 === 89 === Here we report the x-ray absorption fine structure spectroscopy (XAFS) study of a two-step thermal annealing effects on crystal structure and phase transformation of Mg-doped GaN films grown by MOVPE. Measurements were made on the K-edge energies of both...

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Bibliographic Details
Main Authors: Willy Chow, 曹衛立
Other Authors: Wen-Hsiung Chen
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/59768675026357684043