An Embedded Built-In-Self-Test Approach for Digital-to-Analog Converters
碩士 === 國立清華大學 === 電機工程學系 === 89 === Without a large number of precision reference voltages and with the consideration of matching problems, a built-in-self-test approach is proposed to test the parameters of digital-to-analog converter (DAC), which includes offset error, gain error, diffe...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/06962547678221782886 |