An Advanced Memory Built-In Self-Diagnosis Compiler for System-on-Chip

碩士 === 國立清華大學 === 電機工程學系 === 89 === Testing and diagnosis are becoming important issues in system-on-chip (SoC) development while more and more embedded cores are integrated into single chips. We propose a built-in self-test and self-diagnosis scheme for embedded SRAMs and CAMs. It suppor...

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Bibliographic Details
Main Authors: Ruey-Shing Tzeng, 曾瑞興
Other Authors: Cheng-Wen Wu
Format: Others
Language:en_US
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/02519766826668410062