Efficient Double Fault Diagnosis of Combinational Circuits
碩士 === 國立清華大學 === 電機工程學系 === 89 === It has been a hard problem to locate the fault sites in an IC that does not pass the manufacturing test. A diagnosis tool will help a lot to narrow down the suspect region and to ease the burden of failure analysis engineers. Several types of...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/28783646237699323798 |