Mechanistic Study of Thermally Immobilized Cr- or Cu-containing SiO2
碩士 === 東海大學 === 環境科學系 === 89 === X-ray absorption spectroscope (XAS), X-ray diffraction (XRD), scanning electron microscope/energy dispersive spectrometer (SEM/EDS), and the toxicity characteristic leaching procedure (TCLP) technique, were used to study the effect of surface area (SL: 2 and SH: 378...
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/46234999715445772204 |