Multiple Tests to the Improvement of Yield and Quality
碩士 === 中華大學 === 電機工程學系碩士班 === 90 === Abstract In this thesis, we provide a Model for the testing yield and the testing quality, and use the statistical simulation method in order to evaluate the joint probability distribution of a set of manufacturability and testability. By ev...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/63686242768666624242 |