Neutron-Irradiation then O2-Rapid Thermal Annealing Effect on the Microstructural Properties and Reliability of Sputtered Ta2O5/TiO2 Composite Films

碩士 === 義守大學 === 電子工程學系 === 90 === Tantalum pentoxide (Ta2O5)/titanium dioxide (TiO2) composite films were reactively sputtered deposited on P+-type silicon substrate from a tantalum pentoxide and titanium dioxide target using Ar/O2 gas mixtures by reactive sputtering. The effects of neutr...

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Bibliographic Details
Main Authors: Shun-Shan Hsu, 許順山
Other Authors: Ching-Wu Wang
Format: Others
Language:en_US
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/90170964660183956864