New Methods to Characterize the Dielectric Properties of Ferroelectric Thin Films and Device Modeling of the Ferroelectric Memory Field Effect Transistor (FeMFET)
博士 === 國立交通大學 === 電子工程系 === 90 === In this thesis, several topics concerning the dielectric properties, device applications, device simulations and measurement techniques of ferroelectric thin films such as Ba0.5Sr0.5TiO3 (BST), SrTiO3 (STO), SrBi2Ta2O9 (SBT) and (Bi,La)Ta2O9 (BLT) are st...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/37737160475766502884 |