Fabrication and Characterization of SOI FinFETs with Schottky Barrier Source/Drain

碩士 === 國立交通大學 === 電資學院學程碩士班 === 90 === In this thesis, we proposed and demonstrated a novel nano-scale silicon-on-insulator (SOI) FinFET device. The new device features a metallic silicided source/drain and field-induced S/D extensions. For the device fabrication, the patterning of nano-s...

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Bibliographic Details
Main Authors: Fu Ju Hou, 侯福居
Other Authors: Tiao Yuan Huang
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/05591667974984877700