TFT LCD Source Driver IC Testing-Fault Models and Test Generation
碩士 === 國立交通大學 === 電資學院學程碩士班 === 90 === The high density and compact TFT LCD Source Driver IC has been developed recently. The IC contains many non-linear DAC arrays with a characteristic of polarity inversion during operating. Because of these characteristics, there is no well-...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/05050839174836673607 |