Failure Analysis and Reliability Assessments of Photoelectric Protective Device
碩士 === 國立交通大學 === 產業安全與防災學程碩士班 === 90 === ABSTRACT Traditionally when analyzing test data of accelerated degradation, it is used to analyze the distribution of product life through statistical methods. It needs to find the distribution of product life first, and then apply its...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2002
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Online Access: | http://ndltd.ncl.edu.tw/handle/32999184629940931982 |