Spectroscopic Analysis in InGaP/GaAs HBT and GaAs/AlGaAs VCSEL Epitaxial Wafers
碩士 === 國立清華大學 === 材料科學工程學系 === 90 === In the thesis, we apply the photoreflectance (PR) and reflectivity (R) technique on the analysis of heterojunction bipolar transistor (HBT) and vertical cavity surface emitting laser (VCSEL) epitaxial wafers. The samples are grown by metalorganic chem...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/51896361098512843011 |