An Implicit Grouping Algorithm for Multiple Faults Diagnosis of Full-Scan Design
碩士 === 國立清華大學 === 電機工程學系 === 90 === It is a difficult task to locate the fault sites in an IC that fails manufacturing test. But knowing where the fault is helps us to find the manufacturing defect and improve the yield. A diagnosis tool can help us to shrink the suspect region and to eas...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/63064354003108133427 |