Diagonal Test and Diagnostic Schemes for Flash Memories

碩士 === 國立清華大學 === 電機工程學系 === 90 === Embedded flash memory plays an increasingly important role for system-on-chip (SOC), especially for battery-powered devices.Testing and diagnosis of embedded flash memory is becoming one of the key development and production issues for many SOC products...

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Bibliographic Details
Main Authors: Sau-Kwo Chiu, 邱紹國
Other Authors: Cheng-Wen Wu
Format: Others
Language:en_US
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/72315155149683114550