Diagonal Test and Diagnostic Schemes for Flash Memories
碩士 === 國立清華大學 === 電機工程學系 === 90 === Embedded flash memory plays an increasingly important role for system-on-chip (SOC), especially for battery-powered devices.Testing and diagnosis of embedded flash memory is becoming one of the key development and production issues for many SOC products...
Main Authors: | Sau-Kwo Chiu, 邱紹國 |
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Other Authors: | Cheng-Wen Wu |
Format: | Others |
Language: | en_US |
Published: |
2002
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Online Access: | http://ndltd.ncl.edu.tw/handle/72315155149683114550 |
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