The Characterization of Flip Chip Package by Michelson Interferometry Analysis

碩士 === 國立海洋大學 === 光電科學研究所 === 90 === ABSTRACT The objective of the present research activity is to develop an effective technique using Michelson interferometer to characterize the thermal-induced deformations and stress distribution in flip chip packaging(FCP) , and the chip s...

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Bibliographic Details
Main Authors: Chen Shang-Wei, 陳祥維
Other Authors: Wu Yun-Zhong
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/41704702183233156568