Detection of In-line Out-of-control Processes by Monitoring the End-of-line Yield Data
碩士 === 國立臺灣大學 === 工業工程學研究所 === 90 === In this research, we focus on designing a Statistical Process Control (SPC) scheme to detect in-line out-of-control processes by monitoring the end-of-line yield data. Since the end-of-line product lot sequence order is different from the in-line lot order and t...
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| Format: | Others |
| Language: | en_US |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/97370108474034155369 |