An non-referential machine vision approach for BGA substrate inspection
碩士 === 元智大學 === 工業工程與管理學系 === 90 === In this research, a non-referential machine vision method is proposed to detect surface defects on ball grid array (BGA) substrates. Traditional automatic visual inspection systems have used template matching for PCB inspection. They require a large am...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/09794392892906961493 |