矽基上之傳輸線測試結構的設計、量測及分析
碩士 === 國防大學中正理工學院 === 應用物理研究所 === 91 === In order to reduce the effect of parasitic problems on Si transmission lines, which will affect the signal-integrity. Right now, the material in main process of semiconductor use Cu and Low_K, but the method brings the new problem. The thesis will...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/84885514462020803066 |