The Synthesis and CMP Application of Ceria Powder

碩士 === 逢甲大學 === 化學工程學所 === 91 === Abstract As the device feature is gradually shrinking, the quality requirement of abrasive for chemical mechanical polish (CMP) process is stricter. The CMP slurry based on cerium dioxide has higher removal rate, higher selectivity then other kinds of slurry, and...

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Bibliographic Details
Main Authors: Chien-Chih Chiang, 江建志
Other Authors: Chien-Hsing Hsu
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/96844941521592159325