Development of New High Accuracy Measuring System for Birefringence Index and Thickness of Optic Waveplates
碩士 === 國立成功大學 === 機械工程學系碩博士班 === 91 === In this study, a new highly accuracy measurement system for birefringence index and the thickness of an optic waveplate is proposed. This measurement system is composed of a laser interferometer for accurate length measuring, a precise rotatory stepping motor,...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/04993649665917382538 |