Statistical Approaches to Yield Forecast and Yield Mining of IC Manufacturing
碩士 === 國立交通大學 === 統計所 === 91 === The uncontrolled factors in manufacturing cause variations in the yields of wafers in the IC industry. This thesis contains two sections. In the first part, we discuss the problem of yield forecast and decide the number of wafers to be picked from the wafer bank to...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/46091666420537123301 |