Plasma Treated Ta, Ti, and Hf-based Diffusion Barriers for Copper Metallization System

博士 === 國立交通大學 === 機械工程系 === 91 === In this thesis, in order to promote barrier properties to apply in copper metallization, various diffusion barriers and surface treatments on deposited barrier films were prepared. The contents includes the optimum condition of Ta and TaN barrier films was set up,...

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Bibliographic Details
Main Authors: Ou Keng-Liang, 歐耿良
Other Authors: Chou Chang-Pin
Format: Others
Language:en_US
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/38763350823581623724