Fabrication and Analysis of Soft X-Ray Mirror

碩士 === 國立中央大學 === 光電科學研究所 === 91 === Normal incidence multilayer mirrors are actually a key device to developing X-ray optics. Mo/Si multilayer is always the best choice for the soft X-ray wavelength(13.6nm). Calculations of the reflectivity at normal incidence of a Mo/Si stack predict a reflecti...

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Bibliographic Details
Main Authors: Ping-Hsun Lin, 林秉勳
Other Authors: Cheng-Chung Lee
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/20224190127287407104