Failure Analysis of TFT-LCD Source Driver IC with E-Beam Prober linking to VLSI Tester (SC-μ)
碩士 === 國立清華大學 === 電子工程研究所 === 91 === A new system of failure analysis for TFT-LCD Source Driver IC is presented. This system is suitable to two package types (TCP and QTCP) of TFT-LCD Source Driver IC. This system consists of a high success rate (94%) de-capsulate technique, a new fixture...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/21766624871647044170 |