Failure Analysis of TFT-LCD Source Driver IC with E-Beam Prober linking to VLSI Tester (SC-μ)

Failure Analysis of TFT-LCD Source Driver IC with E-Beam Prober linking to VLSI Tester (SC-μ)

碩士 === 國立清華大學 === 電子工程研究所 === 91 === A new system of failure analysis for TFT-LCD Source Driver IC is presented. This system is suitable to two package types (TCP and QTCP) of TFT-LCD Source Driver IC. This system consists of a high success rate (94%) de-capsulate technique, a new fixture...

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Bibliographic Details
Main Authors: I-Ming Cheng, 鄭宜明
Other Authors: Huey-liang Hwang
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/21766624871647044170

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