A Fault-Pattern Based Memory Failure Analysis Methodology
碩士 === 國立清華大學 === 電機工程學系 === 91 === Failure analysis (FA) and diagnosis of memory cores play a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on failure bitmaps and the experiences of the FA engineers is time consuming...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/74076272088620396663 |