A Low-Cost Jitter Measurement Technique for BIST Applications
碩士 === 國立臺灣大學 === 電子工程學研究所 === 91 === In this paper, we present a technique to measure the RMS value of a signal’s period jitter. In the proposed approach, the signal under test is compared with two delayed versions of itself. The collected information corresponds to two points along the...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/27411289837132918341 |