Structural-Fault Oriented Test Program Generation for Microprocessors
碩士 === 國立臺灣大學 === 電子工程學研究所 === 91 === In this thesis, a low-cost processor testing technique is proposed. The method uses a software test program residing in the processor’s memory to perform structure-fault oriented self-testing. First, deterministic test patterns for each component of the processo...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/49005100613680959262 |