Study of Defect Inspection of IC Laser Marking by Using Convariance Matrix Method
碩士 === 國立臺灣科技大學 === 自動化及控制研究所 === 91 === The main purpose of this research is applying the digital image process technique and convariance matrix method to develop a defect inspection system for IC laser marking. In the beginning, the marking area is searched by a fast searching algorithm proposed b...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/81594707256478143774 |