Multilayer Ceramic Capacitor Inspection Using Machine Vision and the Eigenvalues of Covariance Matrices

碩士 === 國立臺北科技大學 === 生產系統工程與管理研究所 === 91 === The aim of this research is to develop an efficient approach for inspecting the specifications (e.g. length and width) and the surface defects of Multilayer Ceramic Capacitor (MLCC) by machine vision and corner detection technique. Theoretically, the curva...

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Bibliographic Details
Main Authors: Shin-Yen Wei, 魏辛燕
Other Authors: Chi-Hao Yeh
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/88779562987505162980