MEMS Testing Using Laser Interferometer

碩士 === 國立臺北科技大學 === 光電技術研究所 === 91 === This thesis is to study the capability of determining MEMS (Microelectromechanicalmechanical system) displacements and profile using interferometers. Where the displacements includes the static and dynamic displacements of a point of the MEMS, and the profile...

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Bibliographic Details
Main Authors: Y. H. Chien, 錢玉涵
Other Authors: S. T. Lin
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/32835467380517499834